Experiment: 6NMF

X-RAY DIFFRACTION

Serial Crystallography (SX)

Initial Refinement Model(s)
Type	Source	Accession Code	Details
experimental model	PDB	5B1B

Crystalization Experiments
ID	Method	pH	Temperature	Details
1	BATCH MODE	6.8	277	36 hour crystallization in a cold room with stirring

Crystal Properties
Matthews coefficient	Solvent content
4.41	72.11

Symmetry
Space Group	P 21 21 21

Diffraction Experiment
ID #	Crystal ID	Scattering Type	Data Collection Temperature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1	1	x-ray	293	PIXEL	CS-PAD XPP		2016-12-07	M	SINGLE WAVELENGTH

Radiation Source
ID #	Source	Type	Wavelength List	Synchrotron Site	Beamline
1	FREE ELECTRON LASER	SLAC LCLS BEAMLINE MFX	1.306	SLAC LCLS	MFX

Sample delivery method
Diffraction ID	Description	Sample Delivery Method
1		injection

Measurement
Diffraction ID	Pulse Duration	Pulse Repetition Rate	Focal Spot Size	Pulse Energy	Photons Per Pulse
1	40 (fs)	120		9.5 (KeV)

Data Reduction
Diffraction ID	Frames Indexed	Crystal Hits	Frames Indexed	Latices Merged
1	21962	24101	21962

Injection
Diffraction ID	Description	Flow Rate	Injector Diameter	Injection Power	Injector Nozzle	Filter Size	Carrier Solvent
1	GDVN	undefined (µl/min)	undefined (µm)

Overall
ID #	Resolution (High)	Resolution (Low)	Percent Possible (Observed)	CC (Half)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1	2.8	15	99.27	0.971	3.6	273		166575

Highest Resolution Shell
ID #	Resolution (High)	Resolution (Low)	Percent Possible (All)	Percent Possible (Observed)	CC (Half)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.8	2.87	99.98		0.15	0.41

Statistics
Diffraction ID	Structure Solution Method	Cross Validation method	Starting model	Resolution (High)	Resolution (Low)	Number Reflections (Observed)	Number Reflections (R-Free)	Percent Reflections (Observed)	R-Factor (Observed)	R-Work	R-Free	R-Free Selection Details	Mean Isotropic B
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	5B1B	2.8	15	166575	8641	99.27	0.17879	0.17602	0.2321	RANDOM	72.918

Temperature Factor Modeling
Anisotropic B[1][1]	Anisotropic B[1][2]	Anisotropic B[1][3]	Anisotropic B[2][2]	Anisotropic B[2][3]	Anisotropic B[3][3]
-2.41			0.66		1.75

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_2_deg	36.217
r_dihedral_angle_3_deg	17.57
r_dihedral_angle_4_deg	15.956
r_long_range_B_refined	12.818
r_long_range_B_other	12.793
r_scangle_other	8.063
r_mcangle_it	7.215
r_mcangle_other	7.215
r_dihedral_angle_1_deg	6.583
r_scbond_it	4.991

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_2_deg	36.217
r_dihedral_angle_3_deg	17.57
r_dihedral_angle_4_deg	15.956
r_long_range_B_refined	12.818
r_long_range_B_other	12.793
r_scangle_other	8.063
r_mcangle_it	7.215
r_mcangle_other	7.215
r_dihedral_angle_1_deg	6.583
r_scbond_it	4.991
r_scbond_other	4.99
r_mcbond_it	4.559
r_mcbond_other	4.555
r_angle_refined_deg	1.775
r_angle_other_deg	1.061
r_chiral_restr	0.104
r_bond_refined_d	0.011
r_gen_planes_refined	0.007
r_bond_other_d	0.003
r_gen_planes_other	0.003
r_nbd_refined
r_nbd_other
r_nbtor_refined
r_nbtor_other
r_xyhbond_nbd_refined
r_xyhbond_nbd_other
r_metal_ion_refined
r_metal_ion_other
r_symmetry_vdw_refined
r_symmetry_vdw_other
r_symmetry_hbond_refined
r_symmetry_hbond_other
r_symmetry_metal_ion_refined
r_symmetry_metal_ion_other
r_scangle_it
r_rigid_bond_restr
r_sphericity_free
r_sphericity_bonded